Semion LLC provides the following FIB Semion Instrumentation:andEM services:

Focused Ion Beam (FIB) Circuit Edits  

FIB Cross sectioning for metrology and failure analysis

High Resolution SEM imaging

EDX X-Ray analysis for material identification

TEM sample preparation and extraction

Photomask repair and modification

Other applications that involve "nano" milling and fabrication

More information about semion is available at: info@semionco.com