Semion LLC
FIB and SEM Applications Specialists
in Hillsboro Oregon
FIB and SEM Applications Specialists
in Hillsboro Oregon
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Semion Instrumentation:
Semion makes use of an FEI Dualbeam FIB/Field Emission SEM.
The FEI xl830 dualbeam system is capable of focused ion beam milling, ion beam deposition and electron beam deposition.
Large selection of deposition gasses for precise deposition of metals and insulators with ion or electron beam. Milling enhancement gasses and image enhancement gasses also available.
EDAX EDS X-Ray detector for material identification.
Probe system for sample manipulation and fragment removal.
This system has the versatility to image and ion mill samples from very small fragments to full 200mm wafers. It is also capable of accepting 300mm wafers for viewing and milling of the center 100mm area.
The system is loadlocked for quick sample throughput and cleanliness.
The Semion facility may be visited and equipment may be viewed by appointment. Please contact Semion for more information.
info@semionco.com
The FEI xl830 dualbeam system is capable of focused ion beam milling, ion beam deposition and electron beam deposition.
Large selection of deposition gasses for precise deposition of metals and insulators with ion or electron beam. Milling enhancement gasses and image enhancement gasses also available.
EDAX EDS X-Ray detector for material identification.
Probe system for sample manipulation and fragment removal.
This system has the versatility to image and ion mill samples from very small fragments to full 200mm wafers. It is also capable of accepting 300mm wafers for viewing and milling of the center 100mm area.
The system is loadlocked for quick sample throughput and cleanliness.
The Semion facility may be visited and equipment may be viewed by appointment. Please contact Semion for more information.
info@semionco.com
